Title :
Testing by Verifying Walsh Coefficients
Author :
Susskind, Alfred K.
Author_Institution :
Department of Electrical and Computer Engineering, Lehigh University
Abstract :
Testing of logic networks by verifying the Walsh coefricients of the outputs is explored. Measurement of one of these can detect arbitrarily many input leads stuck, and just two measurements, requiring little hardware, can detect any single stuck-at fault in appropriately designed networks.
Keywords :
Exhaustive testing; Walsh functions; fault detection; multiple fault detection; short testing; syndrome testing; testable design; testing; truth-table verification; Arithmetic; Art; Circuit faults; Circuit testing; Computer networks; Electrical fault detection; Fault detection; Logic testing; Programming; Very large scale integration; Exhaustive testing; Walsh functions; fault detection; multiple fault detection; short testing; syndrome testing; testable design; testing; truth-table verification;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1983.1676204
