Title :
Practical technique for measurement of second-order nonlinearity in poled glass
Author :
Corbari, C. ; Deparis, O. ; Klappauf, B.G. ; Kazansky, P.G.
Author_Institution :
Optoelectron. Res. Centre, Southampton Univ., UK
fDate :
1/23/2003 12:00:00 AM
Abstract :
A simple and nondestructive technique for measuring the thickness of the nonlinear optical layer in thermally poled glass, providing a minimum measurable thickness of 4 and 1 μm resolution, is demonstrated. This technique is generally applicable to other nonlinear optical layers as well.
Keywords :
dielectric polarisation; nonlinear optical susceptibility; optical glass; optical harmonic generation; silicon compounds; thickness measurement; 4 micron; nondestructive technique; nonlinear optical layer thickness; permanent second-order nonlinearities; second-harmonic light beam; second-order nonlinearity measurement; thermally poled SiO2 glass; thickness measurement;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:20030137
