• DocumentCode
    1148225
  • Title

    Practical technique for measurement of second-order nonlinearity in poled glass

  • Author

    Corbari, C. ; Deparis, O. ; Klappauf, B.G. ; Kazansky, P.G.

  • Author_Institution
    Optoelectron. Res. Centre, Southampton Univ., UK
  • Volume
    39
  • Issue
    2
  • fYear
    2003
  • fDate
    1/23/2003 12:00:00 AM
  • Firstpage
    197
  • Lastpage
    198
  • Abstract
    A simple and nondestructive technique for measuring the thickness of the nonlinear optical layer in thermally poled glass, providing a minimum measurable thickness of 4 and 1 μm resolution, is demonstrated. This technique is generally applicable to other nonlinear optical layers as well.
  • Keywords
    dielectric polarisation; nonlinear optical susceptibility; optical glass; optical harmonic generation; silicon compounds; thickness measurement; 4 micron; nondestructive technique; nonlinear optical layer thickness; permanent second-order nonlinearities; second-harmonic light beam; second-order nonlinearity measurement; thermally poled SiO2 glass; thickness measurement;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:20030137
  • Filename
    1179514
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1148225