DocumentCode :
1148250
Title :
Logic design error diagnosis and correction
Author :
Chung, Pi-Yu ; Wang, Yi-Min ; Hajj, Ibrahim N.
Author_Institution :
Coordinated Sci. Lab., Illinois Univ., Urbana, IL, USA
Volume :
2
Issue :
3
fYear :
1994
Firstpage :
320
Lastpage :
332
Abstract :
Logic verification tools are often used to verify a gate-level implementation of a digital system in terms of its functional specification. If the implementation is found not to be functionally equivalent to the specification, it is important to correct the implementation automatically. This paper describes a formal method for the diagnosis and correction of logic design errors in an incorrect gate-level implementation. We use Boolean equation techniques to search for potential error locations. An efficient search and pruning algorithm is developed by introducing the notion of immediate dominator set. Two correction procedures are proposed. Gate correction corrects errors such as wrong gate type, missing inverters, etc.; line correction corrects errors such as missing wires and wrong connections. Our method is robust and covers all, simple design errors described by Abadir et al. (1988). Experimental results for a set of ISCAS and MCNC benchmark circuits demonstrate the effectiveness of the proposed techniques.<>
Keywords :
Boolean functions; VLSI; combinatorial circuits; logic CAD; Boolean equation techniques; ISCAS benchmark circuits; MCNC benchmark circuits; design error correction; design error diagnosis; functional specification; gate correction; gate type; gate-level implementation; immediate dominator set; line correction; logic verification tools; pruning algorithm; search algorithm; Circuit synthesis; Debugging; Design optimization; Digital systems; Error correction; Inverters; Logic circuits; Logic design; Process design; Timing;
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/92.311641
Filename :
311641
Link To Document :
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