DocumentCode :
114854
Title :
Adhesion enhancement for electroless plating on mold compound for EMI shielding with industrial test compliance
Author :
Tai Min Fee ; Lee Swee Kah ; Goh Soon Lock ; Kok Swee Leong ; Mukai, Koji ; Magaya, Tafadwa
Author_Institution :
Fac. of Electron. & Comput. Eng., Univ. Teknikal Malaysia Melaka, Durian Tungal, Malaysia
fYear :
2014
fDate :
27-29 Aug. 2014
Firstpage :
313
Lastpage :
316
Abstract :
In the manufacturing process, metal capping for EMI shielding is done during the integrated circuit (IC) assembly process, which hinders the attempt of reducing the size of electronic device and also incurs higher cost of assembly. Therefore direct deposition of metal on IC mold compound is desirable. Conventional metal plating techniques, however fail tape test. This paper studies the condition of plating metal directly onto surface of mold compound with the enhancement of novel non-etching adhesion promoter CovaBond MR™. By plating direct onto mold compound, the shielding capping task can be done in array form before the die saw process in IC manufacturing (before IC assembly), which reduce the thickness and dimension of chip and improves design flexibility of circuit board as well as reduce the manufacturing cost. The industrial test results in this paper have proven the performance of the enhanced metal plating technique.
Keywords :
adhesion; assembling; conformance testing; electroless deposition; electromagnetic interference; electromagnetic shielding; electroplating; integrated circuit manufacture; integrated circuit testing; printed circuit design; EMI shielding; IC assembly process; IC manufacturing; IC mold compound; adhesion enhancement; chip dimension; circuit board design flexibility; die saw process; direct deposition; electroless plating; electronic device; enhanced metal plating technique; industrial test; industrial test compliance; integrated circuit assembly process; manufacturing cost reduction; manufacturing process; metal capping; nonetching adhesion promoter CovaBond MR enhancement; shielding capping task; tape test; thickness reduction; Adhesives; Compounds; Metals; Rough surfaces; Surface cleaning; Surface roughness; CovaBond MRTM; EMI shielding; electroless NiP; mold compound; reliability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Electronics (ICSE), 2014 IEEE International Conference on
Conference_Location :
Kuala Lumpur
Type :
conf
DOI :
10.1109/SMELEC.2014.6920860
Filename :
6920860
Link To Document :
بازگشت