Title :
A Simple Random Test Procedure for Detection of Single Intermittent Fault in Combinational Circuits
Author :
Virupakshia, A.R. ; Reddy, V. C V Pratapa
Author_Institution :
Department of Electrical Engineering, Indian Institute of Technology
fDate :
6/1/1983 12:00:00 AM
Abstract :
This paper suggests a method for near-optimal selection of input vector probabilities for random testing of intermittent faults in combinational circuits. The assignment of input vector probabilities is obtained by equalizing the quality factors of all test vectors in a simple way. It is shown that the degree of fault detection is comparable with that of Savir [2].
Keywords :
Combinational circuits; intermittent fault detection; random testing; Circuit faults; Circuit testing; Combinational circuits; Electrical fault detection; Fault detection; Fluctuations; Humidity; Q factor; Stress; Temperature; Combinational circuits; intermittent fault detection; random testing;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1983.1676283
