• DocumentCode
    1148896
  • Title

    New Superjunction LDMOS With N -Type Charges\´ Compensation Layer

  • Author

    Duan, Baoxing ; Yang, Yintang ; Zhang, Bo

  • Author_Institution
    Key Lab. of the Minist. of Educ. for Wide Band-Gap Semicond. Mater. & Devices, Xidian Univ., Xi´´an
  • Volume
    30
  • Issue
    3
  • fYear
    2009
  • fDate
    3/1/2009 12:00:00 AM
  • Firstpage
    305
  • Lastpage
    307
  • Abstract
    A new superjunction lateral double diffused MOSFET (LDMOST) is designed with an N-type buried layer in the P-substrate near the drain to suppress the effect of substrate-assisted depletion resulting from N-type charges´ compensating charges´ imbalance between the pillars of the superjunction layer. By the effect of the electric field modulation, a more uniform surface electric field is obtained by the new high electric field peak introduced by the p-n junction of the P -substrate and N-type charges´ compensation layer. The new effect of reduced bulk field is introduced to improve the vertical breakdown voltage (BV) by reducing the high bulk electric field around the drain. Fabricated N-buried SJ LDMOST with a drift region length of 35 mum and a pillar width of 4.0 mum exhibits a specific on resistance of 98 mOmegamiddotcm2 and a BV of 410 V.
  • Keywords
    MOSFET; electric breakdown; electric fields; junction gate field effect transistors; N-type charge compensation layer; drift region; electric field modulation; p-n junction; substrate-assisted depletion; superjunction LDMOS; superjunction lateral double diffused MOSFET; uniform surface electric field; vertical breakdown voltage; Breakdown voltage (BV); lateral double diffused MOSFET (LDMOST); p-n junction; superjunction;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2009.2012396
  • Filename
    4776505