DocumentCode
1148916
Title
Never say die [integrated circuit tests]
Author
Baines, Sunny
Volume
51
Issue
6
fYear
2005
fDate
6/1/2005 12:00:00 AM
Firstpage
44
Lastpage
48
Abstract
Perfection is an illusion - even integrated circuits that pass all tests at birth can lose their abilities in old age. New research is looking at ways of stopping so many chips ending up on the scrap heap. The paper looks at whether escalating gate counts on integrated circuits will make the fault-free chip an unrealisable ideal, and what this would mean for computer architectures.
Keywords
computer architecture; field programmable gate arrays; integrated circuit testing; logic gates; logic testing; FPGA; computer architectures; fault-free chip; gate counts; integrated circuit tests;
fLanguage
English
Journal_Title
IEE Review
Publisher
iet
ISSN
0953-5683
Type
jour
DOI
10.1049/ir:20050606
Filename
1499163
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