• DocumentCode
    1148916
  • Title

    Never say die [integrated circuit tests]

  • Author

    Baines, Sunny

  • Volume
    51
  • Issue
    6
  • fYear
    2005
  • fDate
    6/1/2005 12:00:00 AM
  • Firstpage
    44
  • Lastpage
    48
  • Abstract
    Perfection is an illusion - even integrated circuits that pass all tests at birth can lose their abilities in old age. New research is looking at ways of stopping so many chips ending up on the scrap heap. The paper looks at whether escalating gate counts on integrated circuits will make the fault-free chip an unrealisable ideal, and what this would mean for computer architectures.
  • Keywords
    computer architecture; field programmable gate arrays; integrated circuit testing; logic gates; logic testing; FPGA; computer architectures; fault-free chip; gate counts; integrated circuit tests;
  • fLanguage
    English
  • Journal_Title
    IEE Review
  • Publisher
    iet
  • ISSN
    0953-5683
  • Type

    jour

  • DOI
    10.1049/ir:20050606
  • Filename
    1499163