• DocumentCode
    1149114
  • Title

    Numerical modeling of melt-wave erosion in conductors [railgun armatures]

  • Author

    Benton, T. ; Stefani, F. ; Satapathy, S. ; Kuo-Ta Hsieh

  • Author_Institution
    Inst. for Adv. Technol., Univ. of Texas, Austin, TX, USA
  • Volume
    39
  • Issue
    1
  • fYear
    2003
  • Firstpage
    129
  • Lastpage
    133
  • Abstract
    This paper presents two numerical approaches to modeling melt-wave erosion in conductors. The first uses a one-dimensional finite-difference formulation and provides a starting point for understanding the effects of applied field and material properties on erosion speed. The second approach involves manipulating material properties in the three-dimensional (3-D) finite-element analysis (FEA) code EMAP3D. Because EMAP3D cannot eject material from the computation in the same manner as the finite-difference code, a "pseudoerosion" algorithm was devised to render cells above the melting temperature nonconducting. A comparison of the two approaches shows results that are in good agreement for depth of magnetic diffusion, current density, and temperature rise, as well as for depth and speed of erosion. These results are encouraging because they suggest that EMAP3D could be used to model melt-wave erosion in realistic 3-D armatures.
  • Keywords
    conductors (electric); current density; finite difference methods; finite element analysis; melting; railguns; wear; 3-D armatures; EMAP3D code; conductors; current density; erosion depth; erosion speed; magnetic diffusion depth; melt-wave erosion; melting temperature; numerical modeling; one-dimensional finite-difference formulation; pseudoerosion algorithm; railgun armatures; temperature rise; three-dimensional finite-element analysis; Conducting materials; Conductors; Finite difference methods; Finite element methods; Magnetic analysis; Magnetic materials; Material properties; Numerical models; Railguns; Temperature;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2002.805871
  • Filename
    1179738