• DocumentCode
    1149178
  • Title

    Test vehicle for a wafer-scale thermal pixel scene simulator

  • Author

    Chapman, G.H. ; Carr, L.S. ; Syrzycki, M.J. ; Dufort, B.

  • Author_Institution
    Sch. of Eng. Sci., Simon Fraser Univ., Burnaby, BC, Canada
  • Volume
    17
  • Issue
    3
  • fYear
    1994
  • fDate
    8/1/1994 12:00:00 AM
  • Firstpage
    334
  • Lastpage
    341
  • Abstract
    A chip sized test vehicle has been created to experiment with the technology and design required for two wafer scale thermal pixel displays: a thermal pixel dynamic scene simulator and a visual-to-thermal converter. The 4.7×4.7 mm device contains a 2×4 array of micromachined thermal pixels, optical detectors, A/D converters, digital pixel control circuitry, and laser links for interconnection. Laser produced defect avoidance schemes allowed testing and harvesting for global redundancy of the control circuitry and local transducer substitution. Also the laser linked signal buses flexibility was used to arrange the chip in different thermal pixel display configurations. Two chips were laser interconnected, one as fabricated and another where anisotropic etching had created a suspended plate holding the polysilicon resistor thermal pixels. From the electrical and laser interconnection points of operation there was no difference between the etched and unetched circuits
  • Keywords
    VLSI; display devices; image convertors; infrared imaging; integrated circuit testing; optical interconnections; packaging; redundancy; silicon; simulation; A/D converters; Si; anisotropic etching; chip sized test vehicle; digital pixel control circuitry; dynamic scene simulator; global redundancy; laser linked signal buses; laser links for interconnection; laser produced defect avoidance schemes; micromachined thermal pixels; optical detectors; polysilicon resistor; suspended plate; thermal pixel displays; visual-to-thermal converter; wafer-scale thermal pixel scene simulator; Circuit simulation; Circuit testing; Displays; Etching; Integrated circuit interconnections; Layout; Optical arrays; Optical control; Sensor arrays; Vehicle dynamics;
  • fLanguage
    English
  • Journal_Title
    Components, Packaging, and Manufacturing Technology, Part B: Advanced Packaging, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1070-9894
  • Type

    jour

  • DOI
    10.1109/96.311782
  • Filename
    311782