DocumentCode :
114921
Title :
Extremum seeking for parameter identification, implementation for electron beam property prediction
Author :
Scheinker, Alexander ; Gessner, Spencer
Author_Institution :
RF Control Group, Los Alamos Nat. Lab., Los Alamos, NM, USA
fYear :
2014
fDate :
15-17 Dec. 2014
Firstpage :
2673
Lastpage :
2678
Abstract :
We report on an experiment performed at the Facility for Advanced Accelerator Experimental Tests (FACET), which is the first two kilometers of the Stanford Linear Accelerator Center (SLAC) linear accelerator, in which a new form of extremum seeking, one with known, bounded update rates, despite operating on an analytically unknown cost function, was utilized in order to provide a real time bunch length estimate of the electron beam. The approach was to simultaneously tune fourteen parameters, such as arbitrary klystron phase shifts and electron bunch energy, in order to match a simulated (LiTrack) bunch energy spread spectrum with the real time wiggler/scintillating YAG crystal signal. The simple adaptive scheme was digitally implemented using Matlab and the Experimental Physics and Industrial Control System (EPICS). The main result is the development of a non-intrusive, non-destructive real-time diagnostic scheme for prediction of bunch length, as well as other beam parameters, the precise control of which is very important for the plasma acceleration scheme being explored at FACET.
Keywords :
electron beams; linear accelerators; particle beam bunching; EPICS; Experimental Physics and Industrial Control System; FACET; Facility for Advanced Accelerator Experimental Tests; Matlab; SLAC linear accelerator; Stanford Linear Accelerator Center; arbitrary klystron phase shift; cost function; electron beam property prediction; electron bunch energy; extremum seeking; parameter identification; simulated bunch energy spread spectrum; Adaptation models; Energy measurement; Length measurement; Real-time systems; Time measurement; Trajectory; Tuning;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Decision and Control (CDC), 2014 IEEE 53rd Annual Conference on
Conference_Location :
Los Angeles, CA
Print_ISBN :
978-1-4799-7746-8
Type :
conf
DOI :
10.1109/CDC.2014.7039798
Filename :
7039798
Link To Document :
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