Title :
TiO2-based extended gate FET pH-sensor: Effect of annealing temperature on its sensitivity, hysteresis and stability
Author :
Yusof, Khairul Aimi ; Herman, Sukreen Hana ; Abdullah, Wan Fazlida Hanim
Author_Institution :
Fac. of Electr. Eng., Univ. Teknol. MARA (UiTM), Shah Alam, Malaysia
Abstract :
In this study, titanium dioxide (TiO2) thin films have been investigated as a sensing membrane of the extended gate field effect transistor (EGFET) for pH detection application. The sol-gel TiO2 has been prepared and spin coated onto the indium tin oxide (ITO) coated glass as a substrate. Then the TiO2/ITO test structures thin films were annealed for 15 min at different temperatures; 300 °C and 400 °C under ambient atmosphere. The pH sensing characterizations of TiO2 thin films were measured by Semiconductor Parametric Device Analyzer in different pH buffer solutions of pH 4, 7, 10 and 12. The sensitivity of TiO2 thin film annealed at 400 °C exhibited a higher sensitivity that is 51 mV/pH compared to the thin film annealed at 300 °C gave slightly lower sensitivity of 49 mV/pH. The hysteresis and drift effect for TiO2 thin films also being investigated in this study. TiO2 thin films annealed at 400 °C obtain better hysteresis and drift value compared to the TiO2 thin films annealed at 300 °C.
Keywords :
annealing; chemical sensors; field effect transistors; glass; indium compounds; membranes; pH measurement; sol-gel processing; spin coating; thin film sensors; titanium compounds; EGFET; TiO2-ITO; annealing temperature; extended gate field effect transistor; hysteresis; indium tin oxide coated glass substrate; pH detection application; pH-sensor; semiconductor parametric device analyzer; sensing membrane; sol-gel preparation; spin coating; stability; temperature 300 degC; temperature 400 degC; thin film sensor; time 15 min; Annealing; Hysteresis; Logic gates; Semiconductor device measurement; Sensitivity; Sensors; Temperature measurement; extended gate field effect transistor; sol-gel; titanium dioxide;
Conference_Titel :
Semiconductor Electronics (ICSE), 2014 IEEE International Conference on
Conference_Location :
Kuala Lumpur
DOI :
10.1109/SMELEC.2014.6920905