Title :
Chaotic Oscillations in a CMOS Inverter Coupled With ESD Protection Circuits Under Radio Wave Excitation
Author :
Myunghwan Park ; Rodgers, John C. ; Lathrop, Daniel P.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Maryland, College Park, MD, USA
Abstract :
This study demonstrates the presence of chaotic oscillations in standard CMOS circuits. At radio-frequencies, ordinary digital circuits can show unexpected nonlinear responses. We examine a CMOS inverter coupled with electrostatic discharging (ESD) protection circuits, designed with 0.35 μm CMOS technology, for evidence of its chaotic oscillations. As the circuit is directly driven by a radio-frequency signal, the circuit enters a chaotic dynamic regime when the input frequency is higher than the maximum operating frequency of CMOS inverter. We observe an aperiodic signal, a broadband spectrum, and a complex spectrum. We discuss the nonlinear physical effects in the given circuit: ESD diode rectification, dc bias shift due to a nonquasi-static regime operation of the ESD PN-junction diode, and a nonlinear resonant feedback current path. In order to predict these chaotic dynamics, we develop a transistor-based model, and compare it with the experimental results. To verify the presence of chaotic oscillations mathematically, we develop an ordinary differential equation model with the circuit-related nonlinearities. The largest Lyapunov exponents are calculated to verify the chaotic oscillations. The importance of this study derives from investigating chaotic oscillations in standard CMOS circuits as circuit-effects due to high-intensity electromagnetic signals.
Keywords :
CMOS integrated circuits; differential equations; electrostatic discharge; invertors; p-i-n diodes; ESD protection circuits; Lyapunov exponents; PN-junction diode; aperiodic signal; broadband spectrum; chaotic oscillations; circuit-effects; circuit-related nonlinearities; dc bias shift; diode rectification; electrostatic discharging protection circuits; high-intensity electromagnetic signals; nonlinear physical effects; nonlinear resonant feedback current path; nonquasi-static regime operation; ordinary differential equation model; radio wave excitation; radio-frequency signal; size 0.35 mum; standard CMOS circuits; transistor-based model; CMOS integrated circuits; Chaos; Electrostatic discharges; Integrated circuit modeling; Oscillators; Radio frequency; Voltage measurement; Chaos; Lyapunov exponent (LEs); electrostatic discharging (ESD); nonlinear circuits; nonquasi-static (NQS);
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
DOI :
10.1109/TEMC.2014.2304542