Title :
Commentary: the Khamis/Higgins model
Author :
Haiyan, Xu. ; Yincai, Tang.
fDate :
3/1/2003 12:00:00 AM
Abstract :
This paper shows that the ´KH model´ proposed by Khamis & Higgins (see ibid., vol.47, p.131-4, 1998) is not a new model but is a special case of the multiple step-stress TFR model for Weibull distributions.
Keywords :
Weibull distribution; failure analysis; life testing; Khamis/Higgins model; Weibull distribution; cumulative exposure model; step-stress accelerated life test; tampered failure-rate model; Acceleration; Educational technology; Hazards; Life estimation; Life testing; Mathematics; Random variables; Shape; Stress; Weibull distribution;
Journal_Title :
Reliability, IEEE Transactions on
DOI :
10.1109/TR.2003.808472
