• DocumentCode
    1149663
  • Title

    Commentary: the Khamis/Higgins model

  • Author

    Haiyan, Xu. ; Yincai, Tang.

  • Volume
    52
  • Issue
    1
  • fYear
    2003
  • fDate
    3/1/2003 12:00:00 AM
  • Firstpage
    4
  • Lastpage
    6
  • Abstract
    This paper shows that the ´KH model´ proposed by Khamis & Higgins (see ibid., vol.47, p.131-4, 1998) is not a new model but is a special case of the multiple step-stress TFR model for Weibull distributions.
  • Keywords
    Weibull distribution; failure analysis; life testing; Khamis/Higgins model; Weibull distribution; cumulative exposure model; step-stress accelerated life test; tampered failure-rate model; Acceleration; Educational technology; Hazards; Life estimation; Life testing; Mathematics; Random variables; Shape; Stress; Weibull distribution;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.2003.808472
  • Filename
    1179787
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1149663