Title :
Diagnosis in the Presence of Known Faults
Author :
Mcpherson, John A. ; Kime, Charles R.
Author_Institution :
IBM San Jose Research Laboratory
Abstract :
Diagnosis of an entire system when known faults are present and diagnosis of particular faults in the system when known faults are present are two diagnosis problems that are relevant to computer systems that are reconfigurable and employ distributed control. These problems are formalized, and a diagnostic model based on a model of Russell and Kime is used to analyze the ability of a system to diagnose all faults and particular faults in the system when some known faults are present.
Keywords :
Computer fault diagnosis; computer fault tolerance; computer system modeling; digital system testing; distributed computing; reconfigurable systems; Degradation; Digital systems; Distributed computing; Distributed control; Fault diagnosis; Fault tolerant systems; Modeling; Particle measurements; Performance evaluation; System testing; Computer fault diagnosis; computer fault tolerance; computer system modeling; digital system testing; distributed computing; reconfigurable systems;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1984.1676360
