• DocumentCode
    1149894
  • Title

    Photoexcited resonance-enhanced nitrogen-trap GaAs1-xPx:N laser

  • Author

    Holonyak, Nick, Jr. ; Dupuis, Russell D. ; Macksey, H. ; Zack, Gregory W. ; Craford, M. George ; Finn, Donald

  • Author_Institution
    University of Illinois, Urbana, IL, USA
  • Volume
    9
  • Issue
    2
  • fYear
    1973
  • fDate
    2/1/1973 12:00:00 AM
  • Firstpage
    379
  • Lastpage
    383
  • Abstract
    Data (77 K) on x = 0.41 and x = 0.46 N-doped GaAS1-xPxare presented showing that the electron-hole recombination probability may be resonantly enhanced when the crystal composition is varied and the \\Gamma conduction band minimum is made degenerate, or nearly degenerate, with the A -line N isoelectronic trap state ( E_{\\Gamma } \\approx E_{N} \\sim 2.0 eV, x \\approx 0.40 ). Data on x = 0.46 GaAs1-xPx:N suggest that resonant enhancement occurs in a "turning" range |E_{\\Gamma } - E_{N}| \\leq 55 meV. A consequence of this work is that photopumped GaAs1-xPx:N ( x = 0.46 ) exhibits laser operation at the unusually high photon energy of 2.032 eV (6100 Å, orange). The idea of resonance-enhanced recombination and the results now demonstrated in GaAs1-xPx:N are general enough to be applicable also to p-n junctions.
  • Keywords
    Doping; Electron traps; Erbium; Gallium arsenide; Laser transitions; P-n junctions; Photoelectricity; Resonance; Spontaneous emission; Stimulated emission;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/JQE.1973.1077464
  • Filename
    1077464