Title :
Gradually-on structure for scan design
Author :
Chen, P.C. ; Wang, J.F. ; Liu, B.D.
Author_Institution :
Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
fDate :
4/23/1992 12:00:00 AM
Abstract :
A new structure named the gradually-on (GO) structure for the full/partial scan design of sequential circuits is proposed. Because this structure allows the scan cells to be turned on gradually, the total test application time can be dramatically reduced.
Keywords :
built-in self test; logic design; logic testing; sequential circuits; full type; gradually-on structure; partial type; scan design; sequential circuits; test application time;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19920548
