Title :
A tanh substitution technique for the analysis of abrupt and graded interface multilayer dielectric stacks
Author :
Corzine, Scott W. ; Yan, R.H. ; Coldren, Larry A.
Author_Institution :
Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA
fDate :
9/1/1991 12:00:00 AM
Abstract :
The authors report a new analytical technique for estimating the peak reflectivity of lossless dielectric stacks with combinations of quarter and/or half-wave thicknesses. A simple variable substitution is used to transform the standard formula for the reflectivity of a Fabry-Perot resonator into a remarkably simplified form. The resulting expressions for reflectivity are intuitively appealing, allowing use of additive algebra to calculate the peak reflectivity of a multilayer dielectric stack
Keywords :
optical films; optical resonators; reflectivity; Fabry-Perot resonator; additive algebra; analytical technique; graded interface multilayer dielectric stacks; half-wave thicknesses; lossless dielectric stacks; peak reflectivity; quarter wave dielectric stack; simple variable substitution; standard formula; tanh substitution technique; Additives; Algebra; Dielectric losses; Fabry-Perot; Mirrors; Nonhomogeneous media; Optical refraction; Reflectivity;
Journal_Title :
Quantum Electronics, IEEE Journal of
