Title :
Error Detection Process—Model, Design, and Its Impact on Computer Performance
Author :
Shin, Kang G. ; Lee, Yann-Hang
Author_Institution :
Computing Research Laboratory, Department of Electrical and Computer Engineering, University of Michigan
fDate :
6/1/1984 12:00:00 AM
Abstract :
Conventionally, reliability analyses either assume that a fault/error is detected immediately as it occurs, or ignore damage caused by imperfect detection mechanisms and error latency, namely, the time interval between the occurrence of an error and the detection of that error.
Keywords :
Computation loss; diagnostics; error detection; latent errors/faults; recovery methods; unreliable results; Computer errors; Computer performance; Delay; Fault detection; Particle measurements; Performance analysis; Predictive models; Process design; System performance; Timing; Computation loss; diagnostics; error detection; latent errors/faults; recovery methods; unreliable results;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1984.1676476
