• DocumentCode
    1150852
  • Title

    n+-SnO2/a-SiC:H/metal thin-film photodiodes with voltage-controlled spectral sensitivity

  • Author

    Rossi, Maria Cristina ; Vincenzoni, Raffaella ; Galluzzi, Fabrizio

  • Author_Institution
    Dipartimento di Ingegneria Elettronica, Rome Univ., Italy
  • Volume
    42
  • Issue
    12
  • fYear
    1995
  • fDate
    12/1/1995 12:00:00 AM
  • Firstpage
    2062
  • Lastpage
    2069
  • Abstract
    n+-SnO2/a-SiC/metal photodiodes with voltage-controlled photosensitivity have been realized by using both carbon-rich and silicon-rich a-SiC alloys. Carbon-rich devices show a response peak located at 530 nm independent of the applied voltage, which in turn only affects the peak height. At variance, in silicon-rich structures the response peak is located at 480, 510, and 570 nm when the applied voltage is -4, 0, and +4 V, respectively, with corresponding quantum yield values of 17, 3, and 25%. For explaining the observed behavior we present a simple model of n+-SnO2/a-SiC/metal diodes, which takes into account light-induced modulation of n+-SnO2/a-SiC barrier height, primary photocurrent generation and photoconductivity effects
  • Keywords
    aluminium; amorphous semiconductors; gold; hydrogen; photodetectors; photodiodes; semiconductor device models; semiconductor materials; silicon compounds; tin compounds; -4 to 4 V; 480 to 570 nm; C-rich a-SiC alloys; I-V characteristics; Si-rich a-SiC alloys; SnO2-SiC:H-Al; SnO2-SiC:H-Au; applied voltage; dark currents; light currents; light-induced modulation; model; n+-SnO2/a-SiC:H/metal thin-film photodiodes; peak height; photoconductivity effects; primary photocurrent generation; quantum yield values; response peak; voltage-controlled photosensitivity; voltage-controlled spectral sensitivity; Contacts; Diodes; Electric variables; Gold; Optical films; Photoconductivity; Photodiodes; Silicon alloys; Silicon carbide; Voltage; Voltage control;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.477762
  • Filename
    477762