• DocumentCode
    115118
  • Title

    A stochastic maximum principle for risk-sensitive mean-field-type control

  • Author

    Djehiche, Boualem ; Tembine, Hamidou ; Tempone, Raul

  • Author_Institution
    Dept. of Math., KTH R. Inst. of Technol., Stockholm, Sweden
  • fYear
    2014
  • fDate
    15-17 Dec. 2014
  • Firstpage
    3481
  • Lastpage
    3486
  • Abstract
    In this paper we study mean-field type control problems with risk-sensitive performance functionals. We establish a stochastic maximum principle for optimal control of stochastic differential equations of mean-field type, in which the drift and the diffusion coefficients as well as the performance functional depend not only on the state and the control but also on the mean of the distribution of the state. Our result extends to optimal control problems for non-Markovian dynamics which may be time-inconsistent in the sense that the Bellman optimality principle does not hold. For a general action space a Peng´s type stochastic maximum principle is derived, specifying the necessary conditions for optimality. Two examples are carried out to illustrate the proposed risk-sensitive mean-field type under linear stochastic dynamics with exponential quadratic cost function. Explicit characterizations are given for both mean-field free and mean-field risk-sensitive models.
  • Keywords
    differential equations; linear systems; maximum principle; stochastic systems; Bellman optimality principle; Peng type stochastic maximum principle; diffusion coefficients; drift coefficients; exponential quadratic cost function; general action space; linear stochastic dynamics; mean-field free models; non-Markovian dynamics; optimal control problems; performance functionals; risk-sensitive mean-field-type control; stochastic differential equations; Couplings; Equations; Mathematical model; Optimal control; Process control; Stochastic processes; Yttrium;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Decision and Control (CDC), 2014 IEEE 53rd Annual Conference on
  • Conference_Location
    Los Angeles, CA
  • Print_ISBN
    978-1-4799-7746-8
  • Type

    conf

  • DOI
    10.1109/CDC.2014.7039929
  • Filename
    7039929