Title :
Reliability models for fault-tolerant private network applications
Author :
Balakrishnan, Meera ; Reibman, Andrew
Author_Institution :
Dept. of Electr. Eng., Duke Univ., Durham, NC, USA
fDate :
9/1/1994 12:00:00 AM
Abstract :
A private or corporate network connects the offices of a single large organization, such as an airline or a bank, using leased private lines. To improve the reliability of network applications, fault-tolerance can be incorporated directly into the private network. In this paper, we use a state-space model to capture the effect of dynamic rerouting and repair and investigate the effect on reliability of different repair-and-rerouting strategies at the application or call level. To reduce the potentially large state space that results, we construct an approximate Markov model with a smaller state space by lumping together similar states. The lumped model includes coverage parameters that can be estimated without considering the original model in its entirety. This allows the state-space model to be solved accurately and efficiently. We compare results of the approximation technique with results obtained by a complete simulation of the original network. We expect similar approximation techniques to be effective on models with large state spaces which obtain processes with many time-scales
Keywords :
Markov processes; fault tolerant computing; lumped parameter networks; parameter estimation; reliability; state-space methods; system recovery; telecommunication network routing; telephone networks; application level; approximate Markov model; call level; corporate network; coverage parameter estimation; dynamic rerouting; fault-tolerant private network applications; leased private lines; lumped model; network simulation; reliability; reliability models; repair strategies; state-space model; time-scales; Electronic switching systems; Fault tolerance; Predictive models; Routing; State-space methods; Switches; Switching circuits; Telecommunication traffic; Telephony; Traffic control;
Journal_Title :
Computers, IEEE Transactions on