DocumentCode
1151543
Title
Analysis of the gain distribution across the active region of InGaAs-InAlGaAs multiple quantum well lasers
Author
Jain, M. ; Roberts, J. ; Ironside, C.N.
Author_Institution
Inst. of Appl. Phys., Univ. of Regensburg, Germany
Volume
152
Issue
4
fYear
2005
Firstpage
209
Lastpage
214
Abstract
Spectral gain measurements for two InGaAs-InAlGaAs multiple width quantum well structures, with inverse-configured active regions, have been presented. One structure consisted of wide quantum wells near the p-side and narrow quantum wells near the n-side of the active region. The other structure consisted of narrow quantum wells near the p-side of the active region with wider quantum wells near the n-side. It is shown that, for the same operating conditions, the structure with wide quantum wells on the p-side of the active region provided a 15% broader gain spectrum in comparison to the structure with narrow quantum wells on the p-side of the active region. The analysis of the results shows non-uniform carrier distribution across the active region of the structures, where the structure with wide quantum wells near the p-side of the active region provided 65% more gain in comparison to the structure with narrow quantum wells near the p-side of the active region. The gain distribution results have been compared with that obtained for the phosphorous quaternary structures in other literature and have shown there is some evidence to suggest that the gain distribution is more uniform in aluminium quaternary than phosphorous quaternary material.
Keywords
III-V semiconductors; aluminium compounds; gallium arsenide; indium compounds; photoluminescence; quantum well lasers; spontaneous emission; InGaAs-InAlGaAs; InGaAs-InAlGaAs multiple quantum well lasers; active region; aluminium quaternary; gain distribution; gain spectrum; inverse-configured active regions; n-side; narrow quantum wells; nonuniform carrier distribution; p-side; phosphorous quaternary material; phosphorous quaternary structures; spectral gain measurements;
fLanguage
English
Journal_Title
Optoelectronics, IEE Proceedings -
Publisher
iet
ISSN
1350-2433
Type
jour
DOI
10.1049/ip-opt:20045069
Filename
1499617
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