DocumentCode :
1151701
Title :
The Histogram Test of ADCs With Sinusoidal Stimulus Is Unbiased by Phase Noise
Author :
Alegria, Francisco Corrêa ; Serra, António Cruz
Author_Institution :
Inst. de Telecomun., Tech. Univ. of Lisbon, Lisbon, Portugal
Volume :
58
Issue :
11
fYear :
2009
Firstpage :
3847
Lastpage :
3854
Abstract :
This paper intends to show that the presence of normally distributed phase noise or jitter in the test setup or in the analog-to-digital converter (ADC) itself does not cause a bias in the sinusoidal histogram test estimation of the transfer function of an ADC. The analytical proof presented demonstrates that there is no need to use an extra overdrive when stimulating the ADC, as is the case with amplitude noise.
Keywords :
analogue-digital conversion; jitter; transfer functions; ADC; analog-to-digital converter; jitter; phase noise; sinusoidal histogram test estimation; sinusoidal stimulus; transfer function; Analog-to-digital converter (ADC); bias; histogram test; jitter; phase noise;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.2009.2020842
Filename :
5175312
Link To Document :
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