Title :
Arbitrary lateral diffusion profiles
Author_Institution :
Philips Lab., Philips Electron. North America Corp., Briarcliff Manor, NY, USA
fDate :
12/1/1995 12:00:00 AM
Abstract :
A simple theory underlying the formation of lateral doping profiles in semiconductor device processing is presented for the first time. The theory shows how an arbitrary lateral doping profile can, in principle, be fabricated by ion implantation and diffusion. Practical applications of the theory are limited only by photolithography and diffusion time. The mask layout and diffusion parameters for a linear lateral profile and a square root lateral profile are detailed
Keywords :
diffusion; doping profiles; ion implantation; semiconductor process modelling; diffusion; ion implantation; lateral doping profiles; mask; photolithography; semiconductor device processing; Annealing; Doping profiles; Fabrication; Helium; Ion implantation; Lithography; Semiconductor devices; Semiconductor impurities; Shape control; Silicon on insulator technology; Termination of employment;
Journal_Title :
Electron Devices, IEEE Transactions on