• DocumentCode
    1151984
  • Title

    Power-bus decoupling with embedded capacitance in printed circuit board design

  • Author

    Xu, Minjia ; Hubing, Todd H. ; Chen, Juan ; Van Doren, Thomas P. ; Drewniak, James L. ; Dubroff, Richard E.

  • Author_Institution
    Hewlett-Packard, San Diego, CA, USA
  • Volume
    45
  • Issue
    1
  • fYear
    2003
  • fDate
    2/1/2003 12:00:00 AM
  • Firstpage
    22
  • Lastpage
    30
  • Abstract
    This paper experimentally investigates the effectiveness of embedded capacitance for reducing power-bus noise in high-speed printed circuit board designs. Boards with embedded capacitance employ closely spaced power-return plane pairs separated by a thin layer of dielectric material. In this paper, test boards with four embedded capacitance materials are evaluated. Power-bus input impedance measurements and power-bus noise measurements are presented for boards with various dimensions and layer stack ups. Unlike discrete decoupling capacitors, whose effective frequency range is generally limited to a few hundred megahertz due to interconnect inductance, embedded capacitance was found to efficiently reduce power-bus noise over the entire frequency range evaluated (up to 5 GHz).
  • Keywords
    capacitance; circuit noise; digital circuits; electromagnetic compatibility; interference suppression; printed circuit design; printed circuit testing; 5 GHz; closely spaced power-return plane pairs; embedded capacitance; high-speed PCB designs; high-speed digital designs; layer stack ups; power-bus decoupling; power-bus input impedance measurements; power-bus noise measurements; power-bus noise reduction; printed circuit board designs; thin dielectric material layer; Capacitance; Circuit noise; Circuit testing; Dielectric materials; Frequency; Impedance measurement; Materials testing; Noise measurement; Noise reduction; Printed circuits;
  • fLanguage
    English
  • Journal_Title
    Electromagnetic Compatibility, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9375
  • Type

    jour

  • DOI
    10.1109/TEMC.2002.808075
  • Filename
    1180390