DocumentCode :
1151994
Title :
Hybridization of FDTD and device behavioral-modeling techniques [interconnected digital I/O ports]
Author :
Grivet-Talocia, Stefano ; Stievano, Igor S. ; Canavero, Flavio G.
Author_Institution :
Dipt. di Elettronica, Politecnico di Torino, Italy
Volume :
45
Issue :
1
fYear :
2003
fDate :
2/1/2003 12:00:00 AM
Firstpage :
31
Lastpage :
42
Abstract :
We present a systematic methodology for the electromagnetic modeling of interconnected digital I/O ports. Digital drivers and receivers are represented through behavioral models based on radial basis functions expansions. Such a technique allows a very accurate representation of nonlinear/dynamic effects as well as switching behavior of real-world components by means of carefully identified discrete-time models. The inclusion of these models into a finite-difference time-domain solver for full-wave analysis of interconnected systems is presented. A rigorous stability analysis shows that use of nonlinear/dynamic discrete-time models can be easily integrated with standard full-wave solvers, even in the case of unmatched sampling time. A set of numerical examples illustrates the feasibility of this method.
Keywords :
computational electromagnetics; digital circuits; electromagnetic compatibility; electromagnetic interference; finite difference time-domain analysis; modelling; numerical stability; transient analysis; EM modeling; EMC; FDTD techniques; device behavioral-modeling techniques; digital drivers; digital receivers; discrete-time models; electromagnetic compatibility; electromagnetic modeling; finite-difference time-domain solver; full-wave analysis; hybridization; interconnected digital I/O ports; interconnected systems; nonlinear circuits; nonlinear/dynamic effects; radial basis functions expansions; signal integrity; stability analysis; standard full-wave solvers; switching behavior; transient analysis; unmatched sampling time; Circuit simulation; Electromagnetic compatibility; Electromagnetic fields; Electromagnetic modeling; Finite difference methods; Geometry; Integrated circuit interconnections; Interconnected systems; Stability analysis; Time domain analysis;
fLanguage :
English
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9375
Type :
jour
DOI :
10.1109/TEMC.2002.808035
Filename :
1180391
Link To Document :
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