Title :
Maximum likelihood estimation of time and frequency offset for OFDM systems
Author :
Lee, J. ; Lou, H. ; Toumpakaris, D.
Author_Institution :
Marvell Semicond. Inc., Sunnyvale, CA, USA
Abstract :
An optimal maximum likelihood (ML) estimator of the time and frequency offset in OFDM systems is presented. The optimal ML estimator fully exploits the redundant information in the cyclic prefix of the OFDM symbol. Simulation results indicate that the optimal ML estimator outperforms an existing suboptimal ML estimator.
Keywords :
OFDM modulation; frequency estimation; maximum likelihood estimation; OFDM systems; frequency offset; maximum likelihood estimation; optimal ML estimator; time offset;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:20046564
