DocumentCode
1152046
Title
Analytical formulation of lightning-induced voltages on multiconductor overhead lines above lossy ground
Author
Hoidalen, H.K.
Author_Institution
Inst. of Electr. Power Eng., Norwegian Univ. of Sci. & Technol., Trondheim, Norway
Volume
45
Issue
1
fYear
2003
fDate
2/1/2003 12:00:00 AM
Firstpage
92
Lastpage
100
Abstract
This paper presents analytical expressions for calculation of lightning-induced voltages (LIV) on multiconductor overhead lines above lossy ground. The transmission-line return-stroke model is used and the propagation effect on the electromagnetic field is approximated by the surface impedance method. Assuming a linear return-stroke current, the standard numerical integrations along the lightning channel and the overhead line are avoided, and the result is a fast and stable formulation that contains only a single convolution integral. The described method applies for distances between 100 m and 10 km and is valid the first few microseconds where the maximum LIV usually occurs. A simplified approach to how to include overhead line losses is also outlined. A model is proposed that can be included in the electromagnetic transients program ATP-EMTP for calculation of LIV in larger and practical systems.
Keywords
electric potential; electromagnetic fields; integral equations; lightning; losses; multiconductor transmission lines; power overhead lines; telecommunication transmission lines; transients; transmission line theory; 100 m to 10 km; ATP-EMTP; convolution integral; electromagnetic field; electromagnetic transients program; lightning-induced voltages; linear return-stroke current; lossy ground; multiconductor overhead lines; numerical simulation; overhead line losses; propagation effect; surface impedance method; transmission-line return-stroke model; Convolution; EMTP; Electromagnetic fields; Electromagnetic modeling; Electromagnetic propagation; Impedance measurement; Lightning; Optical propagation; Transmission lines; Voltage;
fLanguage
English
Journal_Title
Electromagnetic Compatibility, IEEE Transactions on
Publisher
ieee
ISSN
0018-9375
Type
jour
DOI
10.1109/TEMC.2002.804772
Filename
1180397
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