• DocumentCode
    1152451
  • Title

    Testability Conditions for Bilateral Arrays of Combinational Cells

  • Author

    Vergis, Anastasios ; Steiglitz, Kenneth

  • Author_Institution
    Department of Computer Science, University of Minnesota
  • Issue
    1
  • fYear
    1986
  • Firstpage
    13
  • Lastpage
    22
  • Abstract
    Two sets of conditions are derived that make one- dimensional bilateral arrays of combinational cells testable for single faulty cells. The test sequences are preset and, in the worst case, grow quadratically with the size of the array. Conditions for testability in linear time are also derived. The basic cell can operate at the bit or at the word level. An implementation of FIR filters using (systolic) one-dimensional bilateral arrays of cells, which can be considered combinational at the word level, is presented as an example. A straightforward generalization for the two- dimensional case is made; a systolic array used for matrix multiplication is presented as an example for this case.
  • Keywords
    Bilateral arrays; combinational cells; fault detection; linear growth; one-step testability; preset test sequences; quadratic growth; systolic array; testability conditions; Boolean functions; Digital systems; Fabrication; Fault detection; Filters; Helium; Signal mapping; Systolic arrays; Testing; Very large scale integration; Bilateral arrays; combinational cells; fault detection; linear growth; one-step testability; preset test sequences; quadratic growth; systolic array; testability conditions;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/TC.1986.1676653
  • Filename
    1676653