Title :
The Bidirectional Double Latch (BDDL)
Author_Institution :
IBM Data Systems Division
Abstract :
This paper describes a new type of shift register latch that is compatible with LSSD. The new latch has the property that information may be shifted in and out of it in two directions: left to right and right to left.
Keywords :
Design for testability; LSSD; hardware overhead; shift register failure diagnostics; shift register latch; Boolean functions; Circuit testing; Data structures; Hardware; Latches; Logic testing; Sequential analysis; Sequential circuits; Shift registers; Very large scale integration; Design for testability; LSSD; hardware overhead; shift register failure diagnostics; shift register latch;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1986.1676659
