Title :
Comments on "Detection of Faults in Programmable Logic Arrays"
Author :
Ye-wei, Liang ; Wei, Jin
Author_Institution :
Beijing Institute of Computer Technology
Abstract :
This correspondence shows two counter examples which contradict the Theorems 4 and 5 in [1].
Keywords :
Programmable logic arrays; whole path graph method; Arithmetic; Circuit faults; Circuit testing; Computer applications; Counting circuits; Electrical fault detection; Fault detection; Logic arrays; Programmable logic arrays; Programmable logic arrays; whole path graph method;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1986.1676687