DocumentCode
1152775
Title
Comments on "Detection of Faults in Programmable Logic Arrays"
Author
Ye-wei, Liang ; Wei, Jin
Author_Institution
Beijing Institute of Computer Technology
Issue
10
fYear
1986
Firstpage
930
Lastpage
931
Abstract
This correspondence shows two counter examples which contradict the Theorems 4 and 5 in [1].
Keywords
Programmable logic arrays; whole path graph method; Arithmetic; Circuit faults; Circuit testing; Computer applications; Counting circuits; Electrical fault detection; Fault detection; Logic arrays; Programmable logic arrays; Programmable logic arrays; whole path graph method;
fLanguage
English
Journal_Title
Computers, IEEE Transactions on
Publisher
ieee
ISSN
0018-9340
Type
jour
DOI
10.1109/TC.1986.1676687
Filename
1676687
Link To Document