Title :
Modeling SWCNT Bandgap and Effective Mass Variation Using a Monte Carlo Approach
Author :
El Shabrawy, Karim ; Maharatna, Koushik ; Bagnall, Darren ; Al-Hashimi, Bashir M.
Author_Institution :
Sch. of Electron. & Comput. Sci., Univ. of Southampton, Southampton, UK
fDate :
3/1/2010 12:00:00 AM
Abstract :
Synthesizing single-walled carbon nanotubes (SWCNTs) with accurate structural control has been widely acknowledged as an exceedingly complex task culminating in the realization of CNT devices with uncertain electronic behavior. In this paper, we apply a statistical approach in predicting the SWCNT bandgap and effective mass variation for typical uncertainties associated with the geometrical structure. This is first carried out by proposing a simulation-efficient analytical model that evaluates the bandgap (Eg) of an isolated SWCNT with a specified diameter (d) and chirality (??). Similarly, we develop an SWCNT effective mass model, which is applicable to CNTs of any chirality and diameters >1 nm. A Monte Carlo method is later adopted to simulate the bandgap and effective mass variation for a selection of structural parameter distributions. As a result, we establish analytical expressions that separately specify the bandgap and effective mass variability (Eg??, m?? *) with respect to the CNT mean diameter (d??) and standard deviation (d??). These expressions offer insight from a theoretical perspective on the optimization of diameter-related process parameters with the aim of suppressing bandgap and effective mass variation.
Keywords :
Monte Carlo methods; carbon nanotubes; chirality; effective mass; elemental semiconductors; energy gap; semiconductor nanotubes; statistical analysis; C; Monte Carlo modeling; SWCNT bandgap; chirality; effective mass variation; geometrical structure; isolated SWCNT diameter; metallic CNT; semiconducting CNT; simulation-efficient analytical model; single-walled carbon nanotubes; statistical method; structural parameter distributions; Bandgap variation; carbon-nanotube (CNT) device models; effective mass variation; single-walled CNT (SWCNT); third-nearest-neighbor tight-binding (TB) model;
Journal_Title :
Nanotechnology, IEEE Transactions on
DOI :
10.1109/TNANO.2009.2028343