MR head manufacturing sensitivity analysis using transmission line model

Author

Bhattacharyya, Manoj K. ; Simmons, Ralph F.

Author_Institution

Hewlett-Packard Co., Palo Alto, CA, USA

Volume

30

Issue

2

fYear

1994

fDate

3/1/1994 12:00:00 AM

Firstpage

291

Lastpage

297

Abstract

Transmission line based equations are developed to describe the operation of MR heads. An analytical solution for magnetic flux in MR films is derived for linear operation. This transmission line method is used to analyze the design center of shielded dual stripe, soft adjacent layer and barberpole MR heads. Error propagation analysis is used to analyze the manufacturing tolerance sensitivity of these various heads. Finally, a Monte Carlo simulation is used to investigate the expected distribution in performance of manufactured MR heads

Keywords

Monte Carlo methods; magnetic flux; magnetic heads; magnetoresistive devices; sensitivity analysis; transmission line theory; MR head; Monte Carlo simulation; barberpole heads; error propagation analysis; linear operation; magnetic flux; manufacturing sensitivity analysis; manufacturing tolerance; shielded dual stripe; soft adjacent layer; transmission line model; Gaussian processes; Magnetic analysis; Magnetic films; Magnetic flux; Magnetic heads; Mathematical model; Nonlinear equations; Sensitivity analysis; Transmission lines; Virtual manufacturing;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.312275

Filename

312275