Multiple Stuck-Fault Detection and Location in Multivalued Linear Circuits

In this correspondence, we present procedures for constructing universal fault detection test sets as well as fault location test sets for multivalued linear circuits, under a multiple stuck-fault model. The bin packing problem is involved in the procedures. The sizes of the fault detection test set and the fault location test set constructed for an n- variable v-valued linear tree circuit are 1 + ⌈n/(v − 1)⌉ and 1 + ⌈n/ ⌊log2 v⌋ ⌉, respectively. It has been proved that the sizes listed above are optimal for some cases.