DocumentCode :
1153143
Title :
Minimum buffered routing with bounded capacitive load for slew rate and reliability control
Author :
Alpert, Charles J. ; Kahng, Andrew B. ; Liu, Bao ; Mândoiu, Ion I. ; Zelikovsky, Alexander Z.
Author_Institution :
IBM Corp., Austin, TX, USA
Volume :
22
Issue :
3
fYear :
2003
fDate :
3/1/2003 12:00:00 AM
Firstpage :
241
Lastpage :
253
Abstract :
In high-speed digital VLSI design, bounding the load capacitance at gate outputs is a well-known methodology to improve coupling noise immunity, reduce degradation of signal transition edges, and reduce delay uncertainty due to coupling noise. Bounding load capacitance also improves reliability with respect to hot-carrier oxide breakdown and AC self-heating in interconnects, and guarantees bounded input rise/fall times at buffers and sinks. This paper introduces a new minimum-buffer routing problem (MBRP) formulation which requires that the capacitive load of each buffer, and of the source driver, be upper-bounded by a given constant. Our contributions are as follows: We give linear-time algorithms for optimal buffering of a given routing tree with a single (inverting or noninverting) buffer type. For simultaneous routing and buffering with a single noninverting buffer type, we prove that no algorithm can guarantee a factor smaller than 2 unless P=NP and give an algorithm with approximation factor slightly larger than 2 for typical buffers. For the case of a single inverting buffer type, we give an algorithm with approximation factor slightly larger than 4. We give local-improvement and clustering based MBRP heuristics with improved practical performance, and present a comprehensive experimental study comparing the runtime/quality tradeoffs of the proposed MBRP heuristics on test cases extracted from recent industrial designs.
Keywords :
VLSI; buffer circuits; digital integrated circuits; high-speed integrated circuits; integrated circuit design; integrated circuit reliability; network routing; trees (mathematics); bounded capacitive load; high-speed digital VLSI design; linear-time algorithm; minimum buffer routing problem; reliability control; routing tree; slew rate control; Approximation algorithms; Capacitance; Clustering algorithms; Degradation; Delay; Noise reduction; Routing; Signal design; Uncertainty; Very large scale integration;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/TCAD.2002.807888
Filename :
1182070
Link To Document :
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