DocumentCode
1153616
Title
Strip edge shape effects on conductor loss calculations using the Lewin/Vainshtein method
Author
Barsotti, E.L. ; Dunn, J.M. ; Kuester, E.F.
Author_Institution
Colorado Univ., Boulder, CO, USA
Volume
26
Issue
14
fYear
1990
fDate
7/5/1990 12:00:00 AM
Firstpage
983
Lastpage
985
Abstract
Trapezoidal strip conductor edge shapes, the result of undercutting during the fabrication process of microstrip and other planar lines, are shown to appreciably increase conductor loss, according to a perturbational loss calculation method developed by Lewin and Vainshtein and implemented here for microstrip.
Keywords
strip lines; transmission line theory; Lewin/Vainshtein method; conductor loss calculations; edge shape effects; fabrication process; microstrip; perturbational loss calculation method; planar lines; strip conductor edge shapes; strip line losses; trapezoidal strip edge shape; undercutting during fabrication;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19900639
Filename
107969
Link To Document