Title :
Condensed Linear Feedback Shift Register (LFSR) Testing—A Pseudoexhaustive Test Technique
Author :
Wang, Laung-Terng ; McCluskey, Edward J.
Author_Institution :
Center for Reliable Computing, Computer Systems Laboratory, Departments of Electrical Engineering and Computer Science, Stanford University
fDate :
4/1/1986 12:00:00 AM
Abstract :
This paper presents a design technique for linear feedback shift registers that generate test patterns for pseudoexhaustive testing. This technique is applicable to any combinational network in which none of the outputs depends on all inputs. It does not rewire the original network inputs during in-circuit test pattern generation. Thus, the possibility of undetected faults on some inputs is eliminated.
Keywords :
Autonomous test; LFSR testing; built-in self-test; condensed LFSR testing; pseudoexhaustive testing; test pattern generation; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Combinational circuits; Electrical fault detection; Fault detection; Linear feedback shift registers; Polynomials; Test pattern generators; Autonomous test; LFSR testing; built-in self-test; condensed LFSR testing; pseudoexhaustive testing; test pattern generation;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1986.1676772
