Title :
Reduced-kickback regenerative current comparator for high-speed switched-current pipeline analogue-to-digital converters
Author :
Boonsobhak, V. ; Worapishet, A. ; Hughes, J.B.
Author_Institution :
Dept. of Electron. Eng., Mahanakorn Univ. of Technol., Bangkok, Thailand
Abstract :
A reduced-kickback regenerative current comparator based on a master-slave structure is presented. The master and slave comparators first operate concurrently but, soon, the master´s operation is inhibited to prevent the extreme voltage surges, or kickback, from disturbing the driving memory while the slave circuit is allowed to regenerate and produce a valid digital output. Simulations indicate that practically no accuracy degradation in the driving memory cell is detected whereas the same operation using the elementary comparator disturbs the accuracy by more than 4 bits. Designed in a standard 0.35 μm 3.3 V digital CMOS technology, the master-slave comparator achieves a sampling speed of 100 MS/s with 7.5 bit resolution, while dissipating 290 μW of power from a single 1.8 V supply.
Keywords :
CMOS integrated circuits; analogue-digital conversion; current comparators; high-speed integrated circuits; pipeline processing; switched current circuits; 0.35 micron; 1.8 V; 290 muW; 3.3 V; accuracy degradation; digital CMOS technology; driving memory; extreme voltage surges; master-slave structure; pipeline analogue-to-digital converters; reduced-kickback regenerative current comparator; sampling speed; switched-current circuits; valid digital output;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:20030055