• DocumentCode
    1153854
  • Title

    Residual Life Predictions in the Absence of Prior Degradation Knowledge

  • Author

    Gebraeel, Nagi ; Elwany, Alaa ; Pan, Jing

  • Author_Institution
    Milton H. Stewart Sch. of Ind. & Syst. Eng., Georgia Inst. of Technol., Atlanta, GA
  • Volume
    58
  • Issue
    1
  • fYear
    2009
  • fDate
    3/1/2009 12:00:00 AM
  • Firstpage
    106
  • Lastpage
    117
  • Abstract
    Recent developments in degradation modeling have been targeted towards utilizing degradation-based sensory signals to predict residual life distributions. Typically, these models consist of stochastic parameters that are estimated with the aid of an historical database of degradation signals. In many applications, building a degradation database, where components are run-to-failure, may be very expensive and time consuming, as in the case of generators or jet engines. The degradation modeling framework presented herein addresses this challenge by utilizing failure time data, which are easier to obtain, and readily available (relative to sensor-based degradation signals) from historical maintenance/repair records. Failure time values are first fitted to a Bernstein distribution whose parameters are then used to estimate the prior distributions of the stochastic parameters of an initial degradation model. Once a complete realization of a degradation signal is observed, the assumptions of the initial degradation model are revised and improved for future predictions. This approach is validated using real world vibration-based degradation information from a rotating machinery application.
  • Keywords
    failure analysis; maintenance engineering; reliability theory; remaining life assessment; statistical distributions; turbomachinery; Bernstein distribution; degradation-based sensory signals; failure time data utilization; failure time values; maintenance records; prior degradation knowledge; repair records; residual life predictions; rotating machinery; vibration-based degradation information; Bernstein distribution; degradation modeling; prognostics; random coefficients models;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.2008.2011659
  • Filename
    4781602