Title :
Cryogenic performance of a CMOS 32-bit microprocessor subsystem built on the silicon-substrate-based multichip packaging technology
Author :
Lin, M.S. ; Paterson, A.S. ; Ghaffari, H.T.
Author_Institution :
AT&T Bell Lab., Murray Hill, NJ, USA
fDate :
7/5/1990 12:00:00 AM
Abstract :
The performance improvement of a cryogenic CMOS 32-bit microprocessor subsystem built on the newly-developed silicon-substrate-based multichip packaging technology is reported. An 80-100% performance improvement is obtained when the supply voltage is between 4.00 and 5.25 V. The percentage of performance improvement begins increasing when the supply voltage is below 4 V. An approximately 140% performance improvement is observed at a supply voltage of 3.25 V. The percentage of performance improvement of a complicated, real subsystem operated at liquid nitrogen temperature depends on the supply voltage. A small size, high speed, high integration system, packaged on a silicon substrate and operated at liquid nitrogen temperature is possible.
Keywords :
CMOS integrated circuits; hybrid integrated circuits; microprocessor chips; packaging; silicon; substrates; 3.25 to 5.25 V; 32 bit; 77 K; CMOS 32-bit microprocessor subsystem; Si substrate; cryogenic performance; high integration system; liquid N 2 temperature; liquid nitrogen temperature; performance improvement; silicon-substrate-based multichip packaging technology; supply voltage;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19900664