Title :
BITL format: a way of representing boundary scan test vectors
Author_Institution :
Philips Centre for Manuf., Eindhoven, Netherlands
fDate :
7/5/1990 12:00:00 AM
Abstract :
A set of test vectors for a digital board can be written as an ASCII list presenting binary values. This representation is not adequate for shifting in or shifting out boundary scan data. A new vector representation is defined called ´BST integrated test-vector list´ (BITL).
Keywords :
automatic test equipment; logic testing; printed circuit testing; ASCII list presenting binary values; BITL format; BST integrated test-vector list; boundary scan data; digital PCB testing; digital board testing; representing boundary scan test vectors; set of test vectors; vector representation;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19900694
