DocumentCode
1154380
Title
A Complete Noise- and Scattering-Parameters Test-Set
Author
Garelli, Marco ; Ferrero, Andrea ; Bonino, Serena
Author_Institution
Dept. of Electron., Politec. di Torino, Turin
Volume
57
Issue
3
fYear
2009
fDate
3/1/2009 12:00:00 AM
Firstpage
716
Lastpage
724
Abstract
We present an innovative test-set based on a microwave tuner, a vector network analyzer and a Y-factor receiver capable of extracting the noise and the scattering parameters of a two-port device. To the authors´ knowledge, the presented test-set is the first noise system that avoids the use of any microwave switch in the noise measurement branches. A set of reflectometers and a novel calibration scheme are used to measure the tuner´s loss and S-parameters in real time without any tuner precharacterization.
Keywords
S-parameters; calibration; electric noise measurement; microwave reflectometry; reflectometers; S-parameters measurement; Y-factor receiver; calibration scheme; microwave switch; microwave tuner; noise extraction; noise measurement branches; noise-parameters test-set; reflectometers; scattering-parameters test-set; tuner loss measurement; vector network analyzer; Amplifier measurement; multiport scattering calibration; noise figure; noise parameters; scattering calibration; unknown thru;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/TMTT.2009.2013315
Filename
4781800
Link To Document