Parallel-processing techniques for automatic test pattern generation

Some of the more widely used serial automatic test pattern generation (ATPG) algorithms and their stability for implementation on a parallel machine are discussed. The basic classes of parallel machines are examined to determine what characteristics they require of an algorithm if they are to implement it efficiently. Several techniques that have been used to parallelize ATPG are presented. They fall into five major categories: fault partitioning, heuristic parallelization, search-space partitioning, functional (algorithmic) partitioning, and topological partitioning. In each category, an overview is given of the technique, its advantages and disadvantages, the type of parallel machine it has been implemented on, and the results.<>