• DocumentCode
    1154510
  • Title

    Circuit techniques for large CSEA SRAMs

  • Author

    Wingard, Drew E. ; Stark, Don C. ; Horowitz, Mark A.

  • Author_Institution
    Center for Integrated Syst., Stanford Univ., CA, USA
  • Volume
    27
  • Issue
    6
  • fYear
    1992
  • fDate
    6/1/1992 12:00:00 AM
  • Firstpage
    908
  • Lastpage
    919
  • Abstract
    The CMOS-storage emitter-access (CSEA) memory cell offers faster access than the MOS cells used in conventional BiCMOS SRAMs but using it in large memory arrays poses several problems. Novel BiCMOS circuit approaches to address the problems of decoding power, electronic noise, level translation, and write disturbance are described. Results on a 64-kb CSEA SRAM using these techniques are reported. The device, fabricated in an 0.8-μm BiCMOS technology, achieves read access and write pulse time of less than 4 ns while dissipating 1.7 W at a case temperature of 70°C
  • Keywords
    BIMOS integrated circuits; SRAM chips; decoding; 0.8 micron; 1.7 W; 4 ns; 64 kbit; 70 degC; BiCMOS circuit; CMOS-storage emitter-access; SRAMs; decoding; memory cell; BiCMOS integrated circuits; CMOS technology; Circuit noise; Decoding; Helium; Latches; Noise level; Random access memory; Switches; Temperature;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/4.135335
  • Filename
    135335