Title :
Circuit techniques for large CSEA SRAMs
Author :
Wingard, Drew E. ; Stark, Don C. ; Horowitz, Mark A.
Author_Institution :
Center for Integrated Syst., Stanford Univ., CA, USA
fDate :
6/1/1992 12:00:00 AM
Abstract :
The CMOS-storage emitter-access (CSEA) memory cell offers faster access than the MOS cells used in conventional BiCMOS SRAMs but using it in large memory arrays poses several problems. Novel BiCMOS circuit approaches to address the problems of decoding power, electronic noise, level translation, and write disturbance are described. Results on a 64-kb CSEA SRAM using these techniques are reported. The device, fabricated in an 0.8-μm BiCMOS technology, achieves read access and write pulse time of less than 4 ns while dissipating 1.7 W at a case temperature of 70°C
Keywords :
BIMOS integrated circuits; SRAM chips; decoding; 0.8 micron; 1.7 W; 4 ns; 64 kbit; 70 degC; BiCMOS circuit; CMOS-storage emitter-access; SRAMs; decoding; memory cell; BiCMOS integrated circuits; CMOS technology; Circuit noise; Decoding; Helium; Latches; Noise level; Random access memory; Switches; Temperature;
Journal_Title :
Solid-State Circuits, IEEE Journal of