Title :
Analysis of Radiated Emissions From a Printed Circuit Board Using Expert System Algorithms
Author :
Fu, Yan ; Hubing, Todd
Author_Institution :
Dept. of Electr. & Comput. Eng., Missouri Univ., Rolla, MO
Abstract :
Three algorithms developed for expert system electromagnetic compatibility tools are used to evaluate a printed circuit board design. The maximum radiated emissions estimated by the algorithms are compared to the measured data for various board configurations. The algorithms identify the most important electromagnetic interference source mechanisms, drawing attention to the design parameters that have the most significant effect on the radiated emissions
Keywords :
circuit CAD; electromagnetic compatibility; electromagnetic interference; expert systems; printed circuit design; electromagnetic compatibility; electromagnetic interference source mechanisms; expert system algorithms; printed circuit board; radiated emissions; Algorithm design and analysis; Capacitors; Circuit testing; Electromagnetic compatibility; Electromagnetic interference; Electromagnetic modeling; Expert systems; Printed circuits; System testing; Voltage; Circuit board; common-mode; current driven; expert system; radiated EMI; voltage driven;
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
DOI :
10.1109/TEMC.2006.888182
