DocumentCode :
1154829
Title :
Maximum Field Inside a Reverberation Chamber Modeled by the Generalized Extreme Value Distribution
Author :
Orjubin, Gérard
Author_Institution :
Univ. Fed. do Ceara
Volume :
49
Issue :
1
fYear :
2007
Firstpage :
104
Lastpage :
113
Abstract :
Classically, the statistical model of the maximum field inside a reverberation chamber (RC) is derived from the field magnitude model that is only known for the overmoded RC. We propose in this paper to model the maximum field by the generalized extreme value (GEV) distribution, as an application of the Fisher-Tippett theorem that formulates the asymptotic distributions of sample maximum. As the knowledge of the parent distribution (field magnitude) is not required, the GEV distribution is suitable for both overmoded and undermoded regimes (few modes excited). A Monte Carlo simulation illustrates the use of the GEV distribution for the overmoded RC. Modal FEM analysis of the RC extends the application to the undermoded regime. Special attention is brought to the issue of GEV parameter estimation: The so-called L-moments technique is advantageously employed to estimate the parameters from the small data sample. Dispersion of the estimated parameters is approximated and reduced by averaging uncorrelated values obtained from a narrow frequency band
Keywords :
Monte Carlo methods; finite element analysis; reverberation chambers; FEM analysis; Fisher-Tippett theorem; L-moments technique; Monte Carlo simulation; estimated parameters dispersion; field magnitude model; generalized extreme value distribution; reverberation chamber; Electromagnetic compatibility; Erbium; Exponential distribution; Finite element methods; Frequency estimation; Parameter estimation; Reverberation chamber; Statistical distributions; Telecommunications; Testing; Extreme order statistics; L-moments; Monte Carlo simulation; generalized extreme value (GEV) distribution; modal finite element method; reverberation chamber (RC);
fLanguage :
English
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9375
Type :
jour
DOI :
10.1109/TEMC.2006.888172
Filename :
4106097
Link To Document :
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