DocumentCode
1155239
Title
EM and substrate coupling in silicon RFICs
Author
Amaya, Rony ; Popplewell, Peter H R ; Cloutier, Mark ; Plett, Calvin
Author_Institution
Dept. of Electron., Carleton Univ., Ottawa, Ont., Canada
Volume
40
Issue
9
fYear
2005
Firstpage
1968
Lastpage
1971
Abstract
An investigation of coupling between inductors and resonators fabricated in silicon substrates is presented and the effects on RF systems and components are discussed. A novel experimental technique to measure inductor and resonator coupling is presented. The experiment is extremely sensitive, fast, accurate, and unique in that no matching, probe de-embedding, or calibration is necessary as the ratio of two on-chip signals is measured to yield the results.
Keywords
electromagnetic coupling; injection locked oscillators; integrated circuit design; microwave integrated circuits; substrates; EM coupling; RFIC; inductor coupling measurement; resonator coupling measurement; substrate coupling; Circuit simulation; Coupling circuits; Inductance; Inductors; Injection-locked oscillators; Radio frequency; Radiofrequency integrated circuits; Silicon; Transmitters; Voltage-controlled oscillators; EM coupling; RFIC; injection locking; silicon; substrate coupling;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/JSSC.2005.848178
Filename
1501997
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