Title :
Fault Propagation Through Embedded Multiport Memories
Author :
Savir, Jacob ; Mcanney, William H. ; Vecchio, Salvatore R.
Author_Institution :
Data Systems Division, IBM Corporation
fDate :
5/1/1987 12:00:00 AM
Abstract :
An analytical method is described for determining the random pattern testability of permanent faults in the prelogic driving the data-in and the address lines of a multiport random access memory whose outputs are directly observable. The results can be used with minimal extensions to existing detection probability tools such as the cutting algorithm.
Keywords :
Detection probability; Markov chain; embedded memory; fault detection; logic testing; random access memory; random patterns; self-testing; Built-in self-test; Circuit faults; Decoding; Electrical fault detection; Fault detection; Jacobian matrices; Logic testing; Pattern analysis; Random access memory; Read-write memory; Detection probability; Markov chain; embedded memory; fault detection; logic testing; random access memory; random patterns; self-testing;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1987.1676944
