DocumentCode
1155335
Title
Numerical modeling of hot electrons in n-GaAs Schottky-barrier diodes
Author
Hjelmgren, Hans
Author_Institution
Dept. of Appl. Electron Phys., Chalmers Univ. of Technol., Goteborg, Sweden
Volume
37
Issue
5
fYear
1990
fDate
5/1/1990 12:00:00 AM
Firstpage
1228
Lastpage
1234
Abstract
The drift-diffusion model, with the inclusion of the energy balance equations, is used to model DC properties of n-GaAs Schottky diodes at high forward bias voltages. The boundary condition for the energy balance equation at the Schottky contact is based on the assumption that the energy flow across the interface is equal to the energy carried by the electrons. The effects of thermionic-field emission and image force lowering are modeled with a field-dependent barrier height. The incorporation of these two effects resulted in very good agreement between simulated and measured I -V characteristics for diodes with different doping concentrations of the epitaxial layer
Keywords
III-V semiconductors; Schottky-barrier diodes; gallium arsenide; hot carriers; semiconductor device models; DC properties; GaAs; I-V characteristics; boundary condition; drift-diffusion model; energy balance equations; field-dependent barrier height; high forward bias voltages; hot electrons; image force lowering; n-GaAs Schottky-barrier diodes; numerical modelling; thermionic-field emission; Boundary conditions; Electrons; Equations; Numerical models; Schottky barriers; Schottky diodes; Semiconductor process modeling; Thermal force; Thermionic emission; Voltage;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/16.108183
Filename
108183
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