• DocumentCode
    1155335
  • Title

    Numerical modeling of hot electrons in n-GaAs Schottky-barrier diodes

  • Author

    Hjelmgren, Hans

  • Author_Institution
    Dept. of Appl. Electron Phys., Chalmers Univ. of Technol., Goteborg, Sweden
  • Volume
    37
  • Issue
    5
  • fYear
    1990
  • fDate
    5/1/1990 12:00:00 AM
  • Firstpage
    1228
  • Lastpage
    1234
  • Abstract
    The drift-diffusion model, with the inclusion of the energy balance equations, is used to model DC properties of n-GaAs Schottky diodes at high forward bias voltages. The boundary condition for the energy balance equation at the Schottky contact is based on the assumption that the energy flow across the interface is equal to the energy carried by the electrons. The effects of thermionic-field emission and image force lowering are modeled with a field-dependent barrier height. The incorporation of these two effects resulted in very good agreement between simulated and measured I-V characteristics for diodes with different doping concentrations of the epitaxial layer
  • Keywords
    III-V semiconductors; Schottky-barrier diodes; gallium arsenide; hot carriers; semiconductor device models; DC properties; GaAs; I-V characteristics; boundary condition; drift-diffusion model; energy balance equations; field-dependent barrier height; high forward bias voltages; hot electrons; image force lowering; n-GaAs Schottky-barrier diodes; numerical modelling; thermionic-field emission; Boundary conditions; Electrons; Equations; Numerical models; Schottky barriers; Schottky diodes; Semiconductor process modeling; Thermal force; Thermionic emission; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.108183
  • Filename
    108183