• DocumentCode
    1155355
  • Title

    A model-based comparison of AlInAs/GaInAs and InP/GaInAs HBT´s: a Monte Carlo study

  • Author

    Katoh, Riichi ; Kurata, Mamoru

  • Author_Institution
    Toshiba Corp., Kawasaki, Japan
  • Volume
    37
  • Issue
    5
  • fYear
    1990
  • fDate
    5/1/1990 12:00:00 AM
  • Firstpage
    1245
  • Lastpage
    1252
  • Abstract
    The high-speed performances of AlInAs/GaInAs and InP/GaInAs heterojunction bipolar transistors (HBTs) are investigated using a one-dimensional self-consistent particle simulator. Optimum alloy compositions for a graded-gap base structure are obtained for both transistors through the tradeoff between the emitter-charging time and base transit time. The saturation velocity in the GaInAs n-type collector is found to be smaller than that in InP, which has been attributed to the diffusion of a large number of hot back-scattered Γ-valley electrons in the GaInAs collector. The difference in the collector transit time in p-type collectors is trivial, since the maximum electron velocity was restricted to below 1.2×108 cm/s due to a strong nonparabolicity effect. The cutoff frequency for the former and the latter are estimated to be 2 and 1.5 times higher, respectively, than for AlGaAs/GaAs HBTs. These results are attributed to a larger bandgap difference between the emitter and base, to yield a high base built-in field, rather than a larger Γ-L band separation energy in the collector to enhance the velocity overshoot effect
  • Keywords
    III-V semiconductors; Monte Carlo methods; aluminium compounds; gallium arsenide; heterojunction bipolar transistors; indium compounds; semiconductor device models; AlInAs-GaInAs; HBTs; InP-GaInAs; Monte Carlo study; alloy compositions; bandgap difference; base transit time; collector transit time; cutoff frequency; emitter-charging time; graded-gap base structure; heterojunction bipolar transistors; high-speed performances; hot back-scattered Γ-valley electrons; model; one-dimensional self-consistent particle simulator; saturation velocity; velocity overshoot effect; Analytical models; Cutoff frequency; Effective mass; Electrons; Gallium arsenide; Heterojunction bipolar transistors; Indium phosphide; Monte Carlo methods; Particle scattering; Scattering parameters;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.108185
  • Filename
    108185